DfT Solutions Limited provides Design-for-Test(DfT) Training and Consultancy across IC, Board and System test to the Electronics Design communities world wide.
For available courses click here
Eric has over 30 years of experience in the field of design-for-test. He has implemented a wide range of DfT solutions in IC, board, Soc and MCM level test. Eric started his career working with military applications for the UK MoD, implementing customised board level design-for-test solutions.
He moved on from there to establish a test services company, Testech, in the USA for his UK based company providing a wide range of services from DfT consultancy in customer designs to full turn-key packages, delivering tester hardware and test program suites in ICT and Functional Test for a variety of ATE platforms.
Eric has implemented custom scan and BIST based solutions at IC level, boundary scan at IC, SoC and board level, and has developed customised test and diagnosic solutions for MCM applications in satellite systems. Eric has over 12 years experience in the semiconductor industry working for Hitachi and Philips/NXP.